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element eds analysis software suite  (Gatan Inc)


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    Structured Review

    Gatan Inc element eds analysis software suite
    Element Eds Analysis Software Suite, supplied by Gatan Inc, used in various techniques. Bioz Stars score: 96/100, based on 202 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
    https://www.bioz.com/product/element+eds+analysis+software+suite/APEX+Software+for+EDS/pm39410480-96-31-38
    Average 96 stars, based on 202 article reviews
    element eds analysis software suite - by Bioz Stars, 2026-09
    96/100 stars

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    Related Articles

    X-ray Spectroscopy:

    Article Title: Thermodynamic Assessment of Molten Bi x -Sn 1−x (x = 0.1 to 0.9) Alloys and Microstructural Characterization of Some Bi-Sn Solder Alloys
    Article Snippet: The microstructural characterization was conducted through scanning electron microscopy (SEM) FEI QUANTA 250 (FEI Company, Hillsboro, OR, USA), in high vacuum mode, backscattered electron techniques (BSE) using an Angular Backscattered Detector. .. Point analysis, elemental mapping, and semi-quantitative analysis were performed through energy dispersive X-ray spectroscopy (EDS) using the EDAX Element EDS Analysis System consisting of ELEMENT Silicon Drift Detector Fixed and ELEMENT EDS Analysis Software Suite (EDAX APEXTM, DigitalMicrograph 3.6). ..

    Article Title: Processing and Characterization of Spent Nickel-Metal Hydride Type AA Batteries to Recover Valuable Materials (Cobalt, Nickel and Rare Earth Elements).
    Article Snippet: The microstructural characterization was conducted through scanning electron microscopy (SEM) FEI QUANTA 250 (FEI Company, Hillsboro, OR, USA), in high vacuum mode, and backscattered electron techniques (BSEs) using an angular backscattered detector. .. Point analysis, elemental mapping, and semi-quantitative analysis were performed through energy-dispersive X-ray spectroscopy (EDX) using the EDAX Element EDS Analysis System consisting of the ELEMENT Silicon Drift Detector Fixed and the ELEMENT EDS Analysis Software Suite (APEXTM 1.0, EDAX, Mahwah, NJ, USA). .. X-ray diffraction investigations were conducted using an X’PERT MPD PANalytical X-ray diffractometer (PANalytical B.V., Almelo, The Netherlands) with horizontal Bragg– Brentano geometry and Cu Ka radiation.

    Article Title: Processing and Characterization of Spent Nickel–Metal Hydride Type AA Batteries to Recover Valuable Materials (Cobalt, Nickel and Rare Earth Elements)
    Article Snippet: The microstructural characterization was conducted through scanning electron microscopy (SEM) FEI QUANTA 250 (FEI Company, Hillsboro, OR, USA), in high vacuum mode, and backscattered electron techniques (BSEs) using an angular backscattered detector. .. Point analysis, elemental mapping, and semi-quantitative analysis were performed through energy-dispersive X-ray spectroscopy (EDX) using the EDAX Element EDS Analysis System consisting of the ELEMENT Silicon Drift Detector Fixed and the ELEMENT EDS Analysis Software Suite (APEXTM 1.0, EDAX, Mahwah, NJ, USA). .. X-ray diffraction investigations were conducted using an X’PERT MPD PANalytical X-ray diffractometer (PANalytical B.V., Almelo, The Netherlands) with horizontal Bragg–Brentano geometry and Cu Ka radiation.

    Software:

    Article Title: Thermodynamic Assessment of Molten Bi x -Sn 1−x (x = 0.1 to 0.9) Alloys and Microstructural Characterization of Some Bi-Sn Solder Alloys
    Article Snippet: The microstructural characterization was conducted through scanning electron microscopy (SEM) FEI QUANTA 250 (FEI Company, Hillsboro, OR, USA), in high vacuum mode, backscattered electron techniques (BSE) using an Angular Backscattered Detector. .. Point analysis, elemental mapping, and semi-quantitative analysis were performed through energy dispersive X-ray spectroscopy (EDS) using the EDAX Element EDS Analysis System consisting of ELEMENT Silicon Drift Detector Fixed and ELEMENT EDS Analysis Software Suite (EDAX APEXTM, DigitalMicrograph 3.6). ..

    Article Title: Processing and Characterization of Spent Nickel-Metal Hydride Type AA Batteries to Recover Valuable Materials (Cobalt, Nickel and Rare Earth Elements).
    Article Snippet: The microstructural characterization was conducted through scanning electron microscopy (SEM) FEI QUANTA 250 (FEI Company, Hillsboro, OR, USA), in high vacuum mode, and backscattered electron techniques (BSEs) using an angular backscattered detector. .. Point analysis, elemental mapping, and semi-quantitative analysis were performed through energy-dispersive X-ray spectroscopy (EDX) using the EDAX Element EDS Analysis System consisting of the ELEMENT Silicon Drift Detector Fixed and the ELEMENT EDS Analysis Software Suite (APEXTM 1.0, EDAX, Mahwah, NJ, USA). .. X-ray diffraction investigations were conducted using an X’PERT MPD PANalytical X-ray diffractometer (PANalytical B.V., Almelo, The Netherlands) with horizontal Bragg– Brentano geometry and Cu Ka radiation.

    Article Title: Processing and Characterization of Spent Nickel–Metal Hydride Type AA Batteries to Recover Valuable Materials (Cobalt, Nickel and Rare Earth Elements)
    Article Snippet: The microstructural characterization was conducted through scanning electron microscopy (SEM) FEI QUANTA 250 (FEI Company, Hillsboro, OR, USA), in high vacuum mode, and backscattered electron techniques (BSEs) using an angular backscattered detector. .. Point analysis, elemental mapping, and semi-quantitative analysis were performed through energy-dispersive X-ray spectroscopy (EDX) using the EDAX Element EDS Analysis System consisting of the ELEMENT Silicon Drift Detector Fixed and the ELEMENT EDS Analysis Software Suite (APEXTM 1.0, EDAX, Mahwah, NJ, USA). .. X-ray diffraction investigations were conducted using an X’PERT MPD PANalytical X-ray diffractometer (PANalytical B.V., Almelo, The Netherlands) with horizontal Bragg–Brentano geometry and Cu Ka radiation.



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